| ชื่อเรื่อง | : | Transmission electron microscopy (TEM) characterisation of Ru2Si3 thin films formed by solid state reaction of Ru and Si |
| นักวิจัย | : | Pang, Geoffrey. , Blackford, Mark G. , Jelenkovic, Emil. |
| คำค้น | : | Applied research. , 970102 Expanding Knowledge in the Physical Sciences , 091299 Materials Engineering not elsewhere classified. , Transmission electron microscopy. , Thin films. , Transmission electron microscopy (TEM) -- Ru2Si3 , Conference Paper. Full Paper (Non-Refereed) |
| หน่วยงาน | : | Central Queensland University, Australia |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2555 |
| อ้างอิง | : | http://hdl.cqu.edu.au/10018/931737 |
| ที่มา | : | Pang, G, Blackford, M & Jelenkovic, E 2012, 'Transmission electron microscopy (TEM) characterisation of Ru2Si3 thin films formed by solid state reaction of Ru and Si', paper and poster presented at the 17th AINSE Conference on Nuclear and Complementary Techniques of Analysis & 10th Vacuum Society of Australia Congress, 5-7 December, AINSE, Canberra, Australia. |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | 17th AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2012) & 10th Vacuum Society of Australia Congress, Australian National University, Canberra, Australia, 5-7 December 2012. Australia : AINSE, 2012. p. 1-4 4 pages Non-refereed , ACQUIRE [electronic resource] : Central Queensland University Institutional Repository. |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | Transmission electron microscopy investigation on Ru2Si3 thin films formed by solid state reaction of Ru and Si revealed a top layer of SiO2 with embedded Ru clusters. We attribute the formation of the top layer to the oxidation between residual oxygen traces in the nitrogen and the silicon in Ru2Si3 grains. The observation is in agreement with electrical measurements. In addition, an interlayer, which has complex structure and chemistry, was observed between the film and substrate. |
| บรรณานุกรม | : |
Pang, Geoffrey. , Blackford, Mark G. , Jelenkovic, Emil. . (2555). Transmission electron microscopy (TEM) characterisation of Ru2Si3 thin films formed by solid state reaction of Ru and Si.
กรุงเทพมหานคร : Central Queensland University, Australia. Pang, Geoffrey. , Blackford, Mark G. , Jelenkovic, Emil. . 2555. "Transmission electron microscopy (TEM) characterisation of Ru2Si3 thin films formed by solid state reaction of Ru and Si".
กรุงเทพมหานคร : Central Queensland University, Australia. Pang, Geoffrey. , Blackford, Mark G. , Jelenkovic, Emil. . "Transmission electron microscopy (TEM) characterisation of Ru2Si3 thin films formed by solid state reaction of Ru and Si."
กรุงเทพมหานคร : Central Queensland University, Australia, 2555. Print. Pang, Geoffrey. , Blackford, Mark G. , Jelenkovic, Emil. . Transmission electron microscopy (TEM) characterisation of Ru2Si3 thin films formed by solid state reaction of Ru and Si. กรุงเทพมหานคร : Central Queensland University, Australia; 2555.
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