| ชื่อเรื่อง | : | A simple method for evaluating flaw distributions responsible for size effects in the strength of small-scale silicon specimens |
| นักวิจัย | : | Duan, Kai. , Hu, Xiaozhi. |
| คำค้น | : | Engineering. , Plastics. , Weibull distribution. , Fracture mechanics. , Strategic basic research. , 860607 Plastic Products (incl. Construction Materials). , 860699 Industrial Chemicals and Related Products not elsewhere classified. , 090503 Construction Materials. , 091308 Solid Mechanics. , 091599 Interdisciplinary Engineering not elsewhere classified. , Flaw size -- Silicon -- Small-scale specimens -- Strength -- Weibull distribution |
| หน่วยงาน | : | Central Queensland University, Australia |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2549 |
| อ้างอิง | : | http://hdl.cqu.edu.au/10018/40084 , cqu:5118 |
| ที่มา | : | Duan, K & Hu, X 2006, 'A simple method for evaluating flaw distributions responsible for size effects in the strength of small-scale silicon specimens',Key Engineering Materials, vol. 312, pp. 77-82. |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | Key engineering materials. Switzerland. : Trans Tech Publications Ltd., 2006. Vol. 312, (2006), p. 77-82 6 pages Refereed 1013-9826 , ACQUIRE [electronic resource] : Central Queensland University Institutional Repository. |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | A simple means of deconvoluting the size distributions of fracture-controlling flaws from Weibull strength plots for small-scale specimens is proposed. The method makes use a power-law distribution function, empirical in form but self-consistent with a conventional two-parameter Weibull probability distribution. Literature data for single-crystal silicon beam specimens covering a range of widths from mm to nm are analyzed according to this procedure. The analysis indicates a reduction in scatter in addition to increase in strength with diminishing specimen size, and quantifies a systematic tightening in flaw distribution associated with refinement in fabrication method. |
| บรรณานุกรม | : |
Duan, Kai. , Hu, Xiaozhi. . (2549). A simple method for evaluating flaw distributions responsible for size effects in the strength of small-scale silicon specimens.
กรุงเทพมหานคร : Central Queensland University, Australia. Duan, Kai. , Hu, Xiaozhi. . 2549. "A simple method for evaluating flaw distributions responsible for size effects in the strength of small-scale silicon specimens".
กรุงเทพมหานคร : Central Queensland University, Australia. Duan, Kai. , Hu, Xiaozhi. . "A simple method for evaluating flaw distributions responsible for size effects in the strength of small-scale silicon specimens."
กรุงเทพมหานคร : Central Queensland University, Australia, 2549. Print. Duan, Kai. , Hu, Xiaozhi. . A simple method for evaluating flaw distributions responsible for size effects in the strength of small-scale silicon specimens. กรุงเทพมหานคร : Central Queensland University, Australia; 2549.
|
ridm@nrct.go.th ระบบคลังข้อมูลงานวิจัยไทย รายการโปรดที่คุณเลือกไว้
