| ชื่อเรื่อง | : | Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter |
| นักวิจัย | : | Tan, Cher Ming , Yu, Wen Zhi |
| คำค้น | : | DRNTU::Engineering::Electrical and electronic engineering |
| หน่วยงาน | : | Nanyang Technological University, Singapore |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2557 |
| อ้างอิง | : | Tan, C. M., & Yu, W. Z. (2014). Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter. Microelectronics Reliability, 54(5), 960-964. , 0026-2714 , http://hdl.handle.net/10220/19346 , http://dx.doi.org/10.1016/j.microrel.2014.01.009 , 178878 |
| ที่มา | : | - |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | Microelectronics reliability |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure sites before destructive physical analysis of the degraded limiters. |
| บรรณานุกรม | : |
Tan, Cher Ming , Yu, Wen Zhi . (2557). Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter.
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Tan, Cher Ming , Yu, Wen Zhi . 2557. "Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter".
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Tan, Cher Ming , Yu, Wen Zhi . "Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter."
กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2557. Print. Tan, Cher Ming , Yu, Wen Zhi . Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2557.
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