| ชื่อเรื่อง | : | Neighborhood repulsed metric learning for kinship verification |
| นักวิจัย | : | Lu, Jiwen , Hu, Junlin , Zhou, Xiuzhuang , Shang, Yuanyuan , Tan, Yap Peng , Wang, Gang |
| คำค้น | : | DRNTU::Engineering::Electrical and electronic engineering. |
| หน่วยงาน | : | Nanyang Technological University, Singapore |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2555 |
| อ้างอิง | : | Lu, J., Hu, J., Zhou, X., Shang, Y., Tan, Y. P., Wang, G., et al. (2012). Neighborhood repulsed metric learning for kinship verification. 2012 IEEE Conference on Computer Vision and Pattern Recognition. , http://hdl.handle.net/10220/12489 , http://dx.doi.org/10.1109/CVPR.2012.6247978 |
| ที่มา | : | - |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | - |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | Kinship verification from facial images is a challenging problem in computer vision, and there is a very few attempts on tackling this problem in the literature. In this paper, we propose a new neighborhood repulsed metric learning (NRML) method for kinship verification. Motivated by the fact that interclass samples (without kinship relations) with higher similarity usually lie in a neighborhood and are more easily misclassified than those with lower similarity, we aim to learn a distance metric under which the intraclass samples (with kinship relations) are pushed as close as possible and interclass samples lying in a neighborhood are repulsed and pulled as far as possible, simultaneously, such that more discriminative information can be exploited for verification. Moreover, we propose a multiview NRM-L (MNRML) method to seek a common distance metric to make better use of multiple feature descriptors to further improve the verification performance. Experimental results are presented to demonstrate the efficacy of the proposed methods. |
| บรรณานุกรม | : |
Lu, Jiwen , Hu, Junlin , Zhou, Xiuzhuang , Shang, Yuanyuan , Tan, Yap Peng , Wang, Gang . (2555). Neighborhood repulsed metric learning for kinship verification.
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Lu, Jiwen , Hu, Junlin , Zhou, Xiuzhuang , Shang, Yuanyuan , Tan, Yap Peng , Wang, Gang . 2555. "Neighborhood repulsed metric learning for kinship verification".
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Lu, Jiwen , Hu, Junlin , Zhou, Xiuzhuang , Shang, Yuanyuan , Tan, Yap Peng , Wang, Gang . "Neighborhood repulsed metric learning for kinship verification."
กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2555. Print. Lu, Jiwen , Hu, Junlin , Zhou, Xiuzhuang , Shang, Yuanyuan , Tan, Yap Peng , Wang, Gang . Neighborhood repulsed metric learning for kinship verification. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2555.
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