| ชื่อเรื่อง | : | Electromigration reliability of interconnections in RF low noise amplifier circuit |
| นักวิจัย | : | He, Feifei , Tan, Cher Ming |
| คำค้น | : | DRNTU::Engineering::Electrical and electronic engineering. |
| หน่วยงาน | : | Nanyang Technological University, Singapore |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2554 |
| อ้างอิง | : | http://hdl.handle.net/10220/11218 , http://dx.doi.org/10.1016/j.microrel.2011.09.033 |
| ที่มา | : | - |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | Microelectronics reliability |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | With the continuous increase of the circuit complexity and the scaling down of the device size, electromigration (EM) failure in the interconnects has become the determining factor for circuit reliability. Most of the EM circuit simulators in the literature are at 2D level. The application of 2D simulators is limited as the actual physical implementation of the circuit in a wafer is indeed 3D in nature, and is much more complicated than 2D. In this paper, we construct a complete 3D circuit model of a RF low noise amplifier (LNA) circuit, including both the intra- and inter-block interconnects. Electric-thermal-structural simulations are performed and the modifications that help to enhance the EM reliability of the circuit are carried out based on the simulation results. |
| บรรณานุกรม | : |
He, Feifei , Tan, Cher Ming . (2554). Electromigration reliability of interconnections in RF low noise amplifier circuit.
กรุงเทพมหานคร : Nanyang Technological University, Singapore. He, Feifei , Tan, Cher Ming . 2554. "Electromigration reliability of interconnections in RF low noise amplifier circuit".
กรุงเทพมหานคร : Nanyang Technological University, Singapore. He, Feifei , Tan, Cher Ming . "Electromigration reliability of interconnections in RF low noise amplifier circuit."
กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2554. Print. He, Feifei , Tan, Cher Ming . Electromigration reliability of interconnections in RF low noise amplifier circuit. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2554.
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