| ชื่อเรื่อง | : | Thickness-dependent evolutions of domain configuration and size in ferroelectric and ferroelectric-ferroelastic films |
| นักวิจัย | : | Huang, C. W. , Chen, Z. H. , Chen, Lang |
| คำค้น | : | DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films |
| หน่วยงาน | : | Nanyang Technological University, Singapore |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2556 |
| อ้างอิง | : | Huang, C. W., Chen, Z. H., & Chen, L. (2013). Thickness-dependent evolutions of domain configuration and size in ferroelectric and ferroelectric-ferroelastic films. Journal of Applied Physics, 113(9). , 00218979 , http://hdl.handle.net/10220/9930 , http://dx.doi.org/10.1063/1.4794005 |
| ที่มา | : | - |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | Journal of applied physics |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | Non-monotonous thickness-dependent ferroelectric and ferroelectric-ferroelastic domain size scaling behaviors were revealed in ferroelectric films, including three distinct regions: (I) a classical 1/2 power law relationship for thick films, (II) a deviation from the 1/2 scaling relationship for an intermediate thickness range, and (III) an exponential increase in ultrathin films when decreasing the film thickness. The calculations indicate a much narrower region (II) in ferroelectric films with ferroelectric domains than that with ferroelectric-ferroelastic ones. As the film thickness decreases, the stable domain pattern also changes from a ferroelectric-ferroelastic domain to a ferroelectric one, which leads to the divergence of domain size scaling. |
| บรรณานุกรม | : |
Huang, C. W. , Chen, Z. H. , Chen, Lang . (2556). Thickness-dependent evolutions of domain configuration and size in ferroelectric and ferroelectric-ferroelastic films.
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Huang, C. W. , Chen, Z. H. , Chen, Lang . 2556. "Thickness-dependent evolutions of domain configuration and size in ferroelectric and ferroelectric-ferroelastic films".
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Huang, C. W. , Chen, Z. H. , Chen, Lang . "Thickness-dependent evolutions of domain configuration and size in ferroelectric and ferroelectric-ferroelastic films."
กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2556. Print. Huang, C. W. , Chen, Z. H. , Chen, Lang . Thickness-dependent evolutions of domain configuration and size in ferroelectric and ferroelectric-ferroelastic films. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2556.
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