| ชื่อเรื่อง | : | Thickness dependency of field emission in amorphous and nanostructured carbon thin films |
| นักวิจัย | : | Shakerzadeh, Maziar , Teo, Edwin Hang Tong , Tay, Beng Kang |
| คำค้น | : | DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films. |
| หน่วยงาน | : | Nanyang Technological University, Singapore |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2555 |
| อ้างอิง | : | Shakerzadeh, M., Teo, E. H. T., & Tay, B. K. (2012). Thickness dependency of field emission in amorphous and nanostructured carbon thin films. Nanoscale Research Letters, 7(1), 286. , 1556-276X , http://hdl.handle.net/10220/9318 , http://dx.doi.org/10.1186/1556-276X-7-286 |
| ที่มา | : | - |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | Nanoscale research letters |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp2 clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the surface sp2 sites due to large enhancement of electric field on these sites. However, in the case of carbon films with nanocrystals of preferred orientation, the emission strongly depends on the film thickness. sp2-bonded nanocrystals have higher aspect ratio in thicker films which in turn results in higher field enhancement and hence easier electron emission. |
| บรรณานุกรม | : |
Shakerzadeh, Maziar , Teo, Edwin Hang Tong , Tay, Beng Kang . (2555). Thickness dependency of field emission in amorphous and nanostructured carbon thin films.
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Shakerzadeh, Maziar , Teo, Edwin Hang Tong , Tay, Beng Kang . 2555. "Thickness dependency of field emission in amorphous and nanostructured carbon thin films".
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Shakerzadeh, Maziar , Teo, Edwin Hang Tong , Tay, Beng Kang . "Thickness dependency of field emission in amorphous and nanostructured carbon thin films."
กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2555. Print. Shakerzadeh, Maziar , Teo, Edwin Hang Tong , Tay, Beng Kang . Thickness dependency of field emission in amorphous and nanostructured carbon thin films. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2555.
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