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Characterization of MEMS cantilevers using lensless digital holographic microscope

หน่วยงาน Nanyang Technological University, Singapore

รายละเอียด

ชื่อเรื่อง : Characterization of MEMS cantilevers using lensless digital holographic microscope
นักวิจัย : Andrei, Alexandru , Gorecki, Cristophe , Nieradko, Lukasz , Singh, Vijay Raj , Anand, Asundi
คำค้น : DRNTU::Engineering::Electrical and electronic engineering::Microelectromechanical systems.
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2551
อ้างอิง : Andrei, A., Gorecki, C., Nieradko, L., Singh, V. R., & Anand, A. (2008). Characterization of MEMS cantilevers using lensless digital holographic microscope. Optical Micro- and Nanometrology in Microsystems Technology II, 6995. , http://hdl.handle.net/10220/7239 , http://dx.doi.org/10.1117/12.782981 , 143362
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : -
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

In this paper vibration characterization of MEMS cantilevers are presented using lens-less in-line digital holographic microscope (LDHM). In-line digital holography provides larger information capability with higher phase sensitivity, and full CCD sensor area is utilized for real image reconstruction. In lensless in-line digital holographic microscope, a highly diverging beam replaces the conventional microscope objectives to provide the required magnification. The diverging wave geometry also reduces the effect of twin-image wave caused by the in-line holographic geometry. For vibration analysis, the time averaged holograms were recorded corresponding to different vibration states of the cantilevers. Direct numerical evaluation of the amplitude and phase information from single time averaged hologram provides the full-field real time quantitative analysis. The experimental study of vibration measurements of Aluminum nitride (AlN) driven cantilevers is performed. The full field study shows the simultaneous vibration behavior of many cantilevers corresponding to same input conditions. Our study shows the shift in the resonant condition of cantilevers both for first and second resonant frequencies. This kind of analysis is most suitable to optimize and monitoring the fabrication process of cantilevers.

บรรณานุกรม :
Andrei, Alexandru , Gorecki, Cristophe , Nieradko, Lukasz , Singh, Vijay Raj , Anand, Asundi . (2551). Characterization of MEMS cantilevers using lensless digital holographic microscope.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Andrei, Alexandru , Gorecki, Cristophe , Nieradko, Lukasz , Singh, Vijay Raj , Anand, Asundi . 2551. "Characterization of MEMS cantilevers using lensless digital holographic microscope".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Andrei, Alexandru , Gorecki, Cristophe , Nieradko, Lukasz , Singh, Vijay Raj , Anand, Asundi . "Characterization of MEMS cantilevers using lensless digital holographic microscope."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2551. Print.
Andrei, Alexandru , Gorecki, Cristophe , Nieradko, Lukasz , Singh, Vijay Raj , Anand, Asundi . Characterization of MEMS cantilevers using lensless digital holographic microscope. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2551.