| ชื่อเรื่อง | : | Robust intermediate read-out for deep submicron technology CMOS image sensors |
| นักวิจัย | : | Chen, Shoushun , Farid, Boussaid , Amine, Bermak |
| คำค้น | : | DRNTU::Engineering::Electrical and electronic engineering::Electronic systems |
| หน่วยงาน | : | Nanyang Technological University, Singapore |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2551 |
| อ้างอิง | : | Chen, S. S., Farid, B., & Amine, B. (2008). Robust intermediate read-out for deep submicron technology CMOS image sensors. IEEE Sensors Journal, 8(3), 286-294. , 1530-437X , http://hdl.handle.net/10220/6335 , http://dx.doi.org/10.1109/JSEN.2007.912783 |
| ที่มา | : | - |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | IEEE sensors journal |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | In this paper, a CMOS image sensor featuring a novel spiking pixel design and a robust digital intermediate read-out is proposed for deep submicron CMOS technologies. The proposed read-out scheme exhibits a relative insensitivity to the ongoing aggressive scaling of the supply voltage. It is based on a novel compact spiking pixel circuit, which combines digitizing and memory functions. Illumination is encoded into a Gray code using a very simple yet robust Gray 8-bit counter memory. Circuit simulations and experiments demonstrate the successful operation of a 64 64 image sensor, implemented in a 0.35 m CMOS technology. A scalability analysis is presented. It suggests that deep sub-0.18 m will enable the full potential of the proposed Gray encoding spiking pixel. Potential applications include multiresolution imaging and motion detection. |
| บรรณานุกรม | : |
Chen, Shoushun , Farid, Boussaid , Amine, Bermak . (2551). Robust intermediate read-out for deep submicron technology CMOS image sensors.
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Chen, Shoushun , Farid, Boussaid , Amine, Bermak . 2551. "Robust intermediate read-out for deep submicron technology CMOS image sensors".
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Chen, Shoushun , Farid, Boussaid , Amine, Bermak . "Robust intermediate read-out for deep submicron technology CMOS image sensors."
กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2551. Print. Chen, Shoushun , Farid, Boussaid , Amine, Bermak . Robust intermediate read-out for deep submicron technology CMOS image sensors. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2551.
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