| ชื่อเรื่อง | : | Effective channel length and external series resistance models of scaled LDD pMOSFETs operating in a Bi-MOS hybrid-mode environment |
| นักวิจัย | : | Seah, Lionel Siau Hing , Yeo, Kiat Seng , Ma, Jianguo , Do, Manh Anh |
| คำค้น | : | DRNTU::Engineering::Electrical and electronic engineering. |
| หน่วยงาน | : | Nanyang Technological University, Singapore |
| ผู้ร่วมงาน | : | - |
| ปีพิมพ์ | : | 2544 |
| อ้างอิง | : | Seah, S. H., Yeo, K. S., Ma, J. G., & Do, M. A. (2001). Effective channel length and external series resistance models of scaled LDD pMOSFETs operating in a Bi-MOS hybrid-mode environment. IEEE Transactions on Electron Devices, 48(5), 1001-1004. , 0018-9383 , http://hdl.handle.net/10220/4708 , http://dx.doi.org/10.1109/16.918250 |
| ที่มา | : | - |
| ความเชี่ยวชาญ | : | - |
| ความสัมพันธ์ | : | IEEE transactions on electron devices |
| ขอบเขตของเนื้อหา | : | - |
| บทคัดย่อ/คำอธิบาย | : | The effective channel length L-eff and total external series resistance R-TOTEXT of deep submicron lightly doped drain (LDD) pMOSFETs, operating in a Bi-MOS hybrid-mode environment, have been modeled as functions of bias and temperature. The accuracy of the device threshold voltage used in the L-eff and R-TOTEXT extraction routine is discussed. The proposed models have been verified for temperature ranging from 223 K to 398 K and source-to-body voltage V(sb) ≥ 0 V conditions. |
| บรรณานุกรม | : |
Seah, Lionel Siau Hing , Yeo, Kiat Seng , Ma, Jianguo , Do, Manh Anh . (2544). Effective channel length and external series resistance models of scaled LDD pMOSFETs operating in a Bi-MOS hybrid-mode environment.
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Seah, Lionel Siau Hing , Yeo, Kiat Seng , Ma, Jianguo , Do, Manh Anh . 2544. "Effective channel length and external series resistance models of scaled LDD pMOSFETs operating in a Bi-MOS hybrid-mode environment".
กรุงเทพมหานคร : Nanyang Technological University, Singapore. Seah, Lionel Siau Hing , Yeo, Kiat Seng , Ma, Jianguo , Do, Manh Anh . "Effective channel length and external series resistance models of scaled LDD pMOSFETs operating in a Bi-MOS hybrid-mode environment."
กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2544. Print. Seah, Lionel Siau Hing , Yeo, Kiat Seng , Ma, Jianguo , Do, Manh Anh . Effective channel length and external series resistance models of scaled LDD pMOSFETs operating in a Bi-MOS hybrid-mode environment. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2544.
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